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Board-Level Functional Test Selection Method Based on Fault Tree Analysis
and Peng Bai
In 6th International Symposium on Autonomous Systems (ISAS2023)
With the increasing complexity of the circuit board, the cost of board-level functional test ensuring the board quality becomes dramatically high. Data-driven-based test selection methods have been widely studied for test-cost reduction. However, existing test selection methods tend to overfit due to overlooking the root causes of faulty boards. To address this issue, a test selection method based on reliability analysis is proposed. A fault tree oriented to the board-level functional test is established for analyzing the reliability of the board and test items. The reliability analysis result is then effectively utilized to formulate a test selection method. Three indices are introduced to evaluate the test efficiency and the test quality. Experimental results demonstrate the effectiveness of the proposed method.