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Board-Level Functional Test Selection Method Based on Fault Tree Analysis Yaoyao Li, Kangcheng Wang, Yu Kang, Yunbo Zhao, and Peng Bai In 6th International Symposium on Autonomous Systems (ISAS2023) 2023 [Abs] [pdf]
With the increasing complexity of the circuit board, the cost of board-level functional test ensuring the board quality becomes dramatically high. Data-driven-based test selection methods have been widely studied for test-cost reduction. However, existing test selection methods tend to overfit due to overlooking the root causes of faulty boards. To address this issue, a test selection method based on reliability analysis is proposed. A fault tree oriented to the board-level functional test is established for analyzing the reliability of the board and test items. The reliability analysis result is then effectively utilized to formulate a test selection method. Three indices are introduced to evaluate the test efficiency and the test quality. Experimental results demonstrate the effectiveness of the proposed method.